منابع مشابه
Material Properties of Titanium Diboride
The physical, mechanical, and thermal properties of polycrystalline TiB2 are examined with an emphasis on the significant dependence of the properties on the density and grain size of the material specimens. Using trend analysis, property relations, and interpolation methods, a coherent set of trend values for the properties of polycrystalline TiB2 is determined for a mass fraction of TiB2 ⩾ 98...
متن کاملElastic-Stiffness Coefficients of Titanium Diboride
Using resonance ultrasound spectroscopy, we measured the monocrystal elastic-stiffness coefficients, the Voigt C ij, of TiB2. With hexagonal symmetry, TiB2 exhibits five independent C ij: C 11, C 33, C 44, C 12, C 13. Using Voigt-Reuss-Hill averaging, we converted these monocrystal values to quasiisotropic (polycrystal) elastic stiffnesses. Briefly, we comment on effects of voids. From the C ij...
متن کاملReactive Spark Plasma Sintering and Mechanical Properties of Zirconium Diboride–Titanium Diboride Ultrahigh Temperature Ceramic Solid Solutions
Ultrahigh temperature ceramics (UHTCs) such as diborides of zirconium, hafnium tantalum and their composites are considered to be the candidate materials for thermal protection systems of hypersonic vehicles due to their exceptional combination of physical, chemical and mechanical properties. A composite of ZrB2-TiB2 is expected to have better properties. In this study, an attempt has been made...
متن کاملTitanium diboride ceramics for solar thermal absorbers
Titanium diboride (TiB2) is a low-density refractory material belonging to the family of ultra-high temperature ceramics (UHTCs). This paper reports on the production and microstructural and optical characterization of nearly fully dense TiB2, with particular interest to its potential utilization as novel thermal solar absorber. Monolithic bulk samples are produced starting from elemental react...
متن کاملPulsed Laser Deposition of Epitaxial Titanium Diboride Thin Films
Epitaxial titanium diboride thin films have been deposited on sapphire substrates by Pulsed Laser Ablation technique. Structural properties of the films have been studied during the growth by Reflection High Energy Electron Diffraction (RHEED) and ex-situ by means of X-ray diffraction techniques; both kinds of measurements indicate a good crystallographic orientation of the TiB 2 film both in p...
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ژورنال
عنوان ژورنال: Journal of Research of the National Institute of Standards and Technology
سال: 2000
ISSN: 1044-677X
DOI: 10.6028/jres.105.057